SemiTest,
Inc. is a leading supplier of non-invasive and non-destructive
monitoring tools used to detect invisible defects in semiconductor
fabrication.
In addition
to quality control functions, semiconductor manufacturers use
SemiTest's SCA and Epimet systems to analyze, streamline and improve
manufacturing processes, and to develop new processes.
SemiTest's
SCA-2500 Surface Charge Analyzer has an installed base of
over 150 systems. Using proprietary and patented technology, the
SCA-2500 detects common contaminants, processing equipment malfunctions
and human error, which can impact semiconductor devise performance.
SemiTest's
Epimet
Model 2 dramatically reduces the cost of EPI wafer monitoring
without risking quality. Using a patented, non-destructive C-V
method, Epimet provides a complete alternative to Hg-probe or
CV-Schottky that does not require monitor wafers.